confovis GmbH
High-precision AOI and 3D metrology for semiconductor manufacturing.
Company profile
Confovis, based in Jena, Germany, develops and manufactures high-precision Automated Optical Inspection (AOI) and optical 3D surface metrology systems for semiconductor applications. Since 2009, we have delivered customer-specific solutions for photonics, MEMS, 3DIC, and advanced packaging.
Our WAFERinspect platform uses proprietary area-scanning Structured Illumination Microscopy for non-contact, high-resolution 3D measurements with outstanding stability, repeatability, and accuracy. In the same optical path, image-based defect inspection with multiple wavelengths enables flexible detection, classification, and dimensional analysis. GUI-based AI tools support fast recipe creation and automated defect classification.
Our WAFERinspect platform uses proprietary area-scanning Structured Illumination Microscopy for non-contact, high-resolution 3D measurements with outstanding stability, repeatability, and accuracy. In the same optical path, image-based defect inspection with multiple wavelengths enables flexible detection, classification, and dimensional analysis. GUI-based AI tools support fast recipe creation and automated defect classification.
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