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November 12-15, 2024 | Messe München
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Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation

Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation (10 exhibitors)

 
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Bruker Nano Surfaces & Metrology
12489 Berlin, Germany
Empowering Semiconductor Excellence: Proven Metrology Solutions
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E
E+H Metrology GmbH
76185 Karlsruhe, Germany
Measurement tools for the Semiconductor and PV in process control
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G
GBS mbH
98693 Ilmenau, Germany
3D surface measurement technology for detecting surface structures and roughness
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I
Intego GmbH
91058 Erlangen, Germany
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N
NanoFocus AG
46049 Oberhausen, Germany
Manufacturer of optical, high-resolution surface measurement technology
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O
OEG GmbH
15236 Frankfurt (Oder), Germany
Contact angle measuring devices with robot and SECS/GEM interface, micro scriber
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P
Park Systems Europe GmbH
68199 Mannheim, Germany
Park Systems provides nanoscale Metrology tools for Semiconductor Manufacturing
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Polytec GmbH
76337 Waldbronn, Germany
Manufacturer of cutting edge optical measurement solutions
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S
S3 Alliance GmbH
72138 Kirchentellinsfurt, Germany
Experts of the Semiconductor/MEMS market welcome you.
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T
Thermo Electric Company
2260 Westerlo, Belgium
Instrumented wafers to know and control temperature in your process equipment.
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