Parametric Test Systems (3 exhibitors)
100015 Beijing, China
Synergizing Design and Manufacturing, Buliding Application-Driven EDA Flows
10019 Strambino (TO), Italy
Seica develops testing solutions for electronic boards, probe cards, and wafers.
35463 Fernwald, Germany
For any type of microchip or -sensor, SPEA has the optimal testing solution.
http%3A%2F%2Fexhibitors.electronica.de%2F%2Fprj_807%2Fview%2Findex.cfm%3Fnv%3D10.1%26lng%3D2%26clgk%3D2_18.10.16