November 13 – 16, 2018
Messe München
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Attolight AG
Nanometer resolution spectroscopy based on quantitative cathodoluminescence for defect inspection in III-V Compound Semiconductor Industry.
Product and service range
17.5.17 Microscopes: SEM; Focused Ion Beam (FIB), TEM
17.31.6 Failure Analysis and other Analytical Services
Applications
Industrial electronics
LED/SSL
Attolight AG
EPFL Innovation Park, Building D
1015 Lausanne
Switzerland
P +41 21 62601-00
contact@
attolight.com
www.attolight.com
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Hall A4 Booth 567
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