Weltleitmesse und Konferenz der Elektronik
15.-18. November 2022 | Messe München
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Messinstrumente für die Prozesskontrolle in der Halbleiter- und PV-Industrie


E+H offers for more than 40 years now a wide variety of measurement tools for the Semiconductor and PV in process control and laboratory characterization.

Contactless metrology tools for 1" up to 450mm Wafers consisting out of Silicon, Quartz, Sapphire etc, but also solutions for other materials such as plastic displays are available.

Most metrology tools can be integrated into our own full automated wafer handling solutions (belt driven, robot).

This long term support for our customers combined with robust, reliable, mature and low maintenance products makes E+H a strong partner on which you can rely on.